Description:Extraction of X-ray Diffraction Profiles
Abstract:The X-ray is a technique used a lot in some areas (physical, materials science, medicine) to obtain information about the particle which the X-ray hits (e.g. size and shape of the particle). X-ray diffraction can be measured and represented in a graph where the minimum and maximum intensities of the rays are shown. The particle information is obtained through parameters that originated the peaks in that graph. But, in this graph some peaks can be severely overlapped. The problem is to define which parameters originated these peaks and how many peaks exist in the graph. If the peaks are overlapped there will be a set of good solutions and it will be necessary to decide from that set which will be the best one. Because of the extremely huge number of possible solutions the search process is computationally very expensive; it would take years in a single processor to find the mentioned peaks. This time can be reduced seriously by porting the application to a Desktop Grid.
The application was ported within the framework of the FP7 EDGeS project.